If you are in search of dependable 1N6657LTXV Semiconductor Devices Unitized products, you can count on Rapid Mil Parts. You have taken a particular interest in part number 1N6657LTXV, a Solid State Devices Inc component that is listed with the NSN 5961013913735 for identification purposes. When you are prepared to start the purchasing process for part number 1N6657LTXV, we provide online RFQ forms to fill out and submit for the means of receiving competitive quotes for your comparisons.
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Our dedication to quality is not merely a statement, and we strive to always exceed industry expectations for your benefit with the best NSN products, aerospace parts, military and defense parts, and other similar items on the market. For your convenience, part number 1N6657LTXV is listed alongside the NSN 5961-01-391-3735 and is categorized under the FSC 5961 Semiconductor Devices and Associated Hardware.
Additionally, this NSN part is specifically produced under CAGE Code 30043, which identifies the specific Solid State Devices Inc facility it traces back to. If you are interested in kicking off procurement for your needs through phone or email or simply wish to discuss our diverse services and your purchasing options, do not hesitate to connect with a staff member of ours today!
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-391-3735 Item PartTypeName: SEMICONDUCTOR DEVICES,UNITIZED | 5961 | 013913735 | 0 | N | A | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | A | G | ||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| PRD3099 | 5 | 9 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | CERAMIC |
| ABMK | OVERALL WIDTH | 0.545 INCHES MAXIMUM |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | TO-254AA |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 100.0 MAXIMUM REVERSE VOLTAGE,INSTANTANEOUS ALL SEMICONDUCTOR DEVICE DIODE AND 100.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE ALL SEMICONDUCTOR DEVICE DIODE |
| TEST | TEST DATA DOCUMENT | 35351-171280 DRAWING (THIS IS THE BASIC GOVERNING DRAWING,SUCH AS A CONTRACTOR DRAWING,ORIGINAL EQUIPMENT MANUFACTURER DRAWING,ETC.; EXCLUDES ANY SPECIFICATION,STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWI |
| PMLC | PRECIOUS MATERIAL AND LOCATION | TERMINAL AREAS IAW MIL-STD-2000 PARA. 5.4.17.2 GOLD |
| PRMT | PRECIOUS MATERIAL | GOLD |
| TTQY | TERMINAL TYPE AND QUANTITY | 3 PIN |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 40.00 AMPERES FORWARD CURRENT,AVERAGE ABSOLUTE ALL SEMICONDUCTOR DEVICE DIODE AND 400.00 AMPERES FORWARD CURRENT,AVERAGE PRESET ALL SEMICONDUCTOR DEVICE DIODE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 175.0 DEG CELSIUS JUNCTION |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| ABHP | OVERALL LENGTH | 0.990 INCHES MAXIMUM |
| ABKW | OVERALL HEIGHT | 0.560 INCHES MAXIMUM |
| AKPV | MOUNTING FACILITY QUANTITY | 4 |
| ASCK | RESPONSE TIME | 35.0 NANOSECONDS MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| AXGY | MOUNTING METHOD | TERMINAL AND UNTHREADED HOLE |
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